The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2006

Filed:

Aug. 11, 2004
Applicants:

Bradley R. Gunn, Fremont, CA (US);

Alberto J. Calderon, San Jose, CA (US);

Jovan Jovanovic, Santa Clara, CA (US);

David S. Hendrickson, Los Gatos, CA (US);

Inventors:

Bradley R. Gunn, Fremont, CA (US);

Alberto J. Calderon, San Jose, CA (US);

Jovan Jovanovic, Santa Clara, CA (US);

David S. Hendrickson, Los Gatos, CA (US);

Assignee:

Aehr Test Systems, Fremont, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01R 12/00 (2006.01); H05K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system is provided which allows for burn-in testing of electronic devices wherein power current is provided individually to each one of the electronic devices. The system also includes various connectors, cables, and other configurations that allow for power currents having large magnitudes to be provided to the electronic devices.


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