The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Dec. 20, 2000
Suzanne Valentine, Atlanta, GA (US);
Krishna Venkatraman, Menlo Park, CA (US);
Phil Delurgio, Dana Point, CA (US);
Michael Neal, San Francisco, CA (US);
Hau Lee, Los Alto, CA (US);
Suzanne Valentine, Atlanta, GA (US);
Krishna Venkatraman, Menlo Park, CA (US);
Phil Delurgio, Dana Point, CA (US);
Michael Neal, San Francisco, CA (US);
Hau Lee, Los Alto, CA (US);
Demandtec, Inc., San Carlos, CA (US);
Abstract
Disclosed are methods, media and systems for generating imputing econometric variables from raw econometric data. A method for generating cleansed initial dataset from corrected raw econometric data comprises inputting raw econometric data, formatting and classifying the raw econometric, conducting an initial error detection and correction, defining a store data set hierarchy, conducting a second error detection and correction, defining product attributes and demand groups, updating attribute information, defining equivalizing factors, conducting a third error detection and correction, subsetting data to facilitate increased processing speeds, conducting a fourth error detection and correction and outputting the cleansed initial dataset. Another embodiment, capable of generating imputing econometric variables from corrected raw econometric data comprises receiving the raw econometric data, detecting errors in the raw econometric data, correcting the detected errors in the raw econometric data to generate a cleansed initial dataset, and generating imputed econometric variables using the cleansed initial dataset.