The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Mar. 19, 2003
Paul Tracy, Sunnyvale, CA (US);
Michael Harms, Pleasanton, CA (US);
Jayabrata Ghosh Dastidar, Santa Clara, CA (US);
Steven Perry, High Wycombe, GB;
Paul Tracy, Sunnyvale, CA (US);
Michael Harms, Pleasanton, CA (US);
Jayabrata Ghosh Dastidar, Santa Clara, CA (US);
Steven Perry, High Wycombe, GB;
Altera Corporation, San Jose, CA (US);
Abstract
Method and apparatus for application specific testing of PLDs. The PLD has a number of resources, less than all of which are used for implementing a customer application. The method includes the following steps. The set of resources that is used for implementing the customer application is identified. A test is then performed only on the set and a test result is generated. Defective resources may be replaced. The PLD is identified as defective only if one of the resources associated with the customer application is defective. Such application specific testing allows the ability of the customer to perform in-system testing, the reduction of the time required for testing the PLD, and the testing of PLDs based on knowledge of the customer's application, among other advantages.