The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Mar. 29, 2001
Applicants:
Bal S. Sandhu, Fremont, CA (US);
Yanmei Tian, Sunnyvale, CA (US);
Chih-chang Lin, Santa Clara, CA (US);
Inventors:
Bal S. Sandhu, Fremont, CA (US);
Yanmei Tian, Sunnyvale, CA (US);
Chih-Chang Lin, Santa Clara, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/38 (2006.01); H03F 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
A high frequency data transmission circuit including design for testability (DFT) features. An integrated circuit includes core control logic to provide a data signal and output drive logic including a local data latch and a transmitter. The data latch receives the data signal and provides true and complementary forms of the data signal to the transmitter over symmetrical signal paths. The transmitter provides an output signal to an external receiver.