The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Mar. 03, 2005
Applicants:

Allan T. Davidson, San Jose, CA (US);

Satwant Singh, Fremont, CA (US);

Inventors:

Allan T. Davidson, San Jose, CA (US);

Satwant Singh, Fremont, CA (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed for providing output impedance measurement techniques. For example, in accordance with an embodiment of the present invention, a system includes a controller adapted to measure an output impedance of a first circuit that provides an output signal having a first voltage level. The output signal from the first circuit is compared to a plurality of voltage levels provided by the controller, with the controller determining the output impedance of the first circuit based on the results of the comparison.


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