The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Jan. 12, 2005
Applicants:

Ko-hsing Chang, Hsinchu, TW;

Chiu-tsung Huang, Hsinchu, TW;

Inventors:

Ko-Hsing Chang, Hsinchu, TW;

Chiu-Tsung Huang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8242 (2006.01); H01L 21/20 (2006.01); H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a semiconductor device. The method comprises steps of providing a substrate having a first metal layer and a second metal layer formed thereon. A first dielectric layer, an etching stop layer having a first opening located above the first metal layer and a second opening located above the second metal layer and a second dielectric layer are formed sequentially. A portion of the first dielectric layer and a portion of the second dielectric layer are removed to form a first trench exposing the first metal layer. A capacitor dielectric layer is formed over the substrate. A third opening is formed in the capacitor dielectric layer. A portion of the second dielectric layer and a portion of the first dielectric layer exposed by the third opening are removed to form an opening. A metal layer is formed to fill out the first trench and the opening.


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