The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Nov. 17, 2003
Applicants:

Albrecht Jander, Corvallis, OR (US);

Catherine A. Nordman, St. Paul, MN (US);

Zhenghong Qian, Eden Prairie, MN (US);

Carl H. Smith, Chatham, NJ (US);

Inventors:

Albrecht Jander, Corvallis, OR (US);

Catherine A. Nordman, St. Paul, MN (US);

Zhenghong Qian, Eden Prairie, MN (US);

Carl H. Smith, Chatham, NJ (US);

Assignee:

NVE Corporation, Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/127 (2006.01);
U.S. Cl.
CPC ...
Abstract

A ferromagnetic thin-film based magnetic field sensor with first and second sensitive direction sensing structures each having a nonmagnetic intermediate layer with two major surfaces on opposite sides thereof having a magnetization reference layer on one and an anisotropic ferromagnetic material sensing layer on the other having a length in a selected length direction and a smaller width perpendicular thereto and parallel to the relatively fixed magnetization direction. The relatively fixed magnetization direction of said magnetization reference layer in each is oriented in substantially parallel to the substrate but substantially perpendicular to that of the other. An annealing process is used to form the desired magnetization directions.


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