The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Dec. 28, 2004
Applicant:

William Devey, Beaverton, OR (US);

Inventor:

William DeVey, Beaverton, OR (US);

Assignee:

Credence Systems Corporation, Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit (IC) tester includes a set of power modules mounted in a test head, each contacting a device interface board (DIB). The DIB provides power paths for delivering an output current generate by each power module to a power input terminals of one or more IC devices under test (DUTs). Power modules that supply current to the same set of DUTs communicate with one another though conductive paths provided by the DIB to ensure that all power modules begin supplying load current to that set of DUTs at the same time and to ensure that all power modules supply substantially the same amount of load current to those DUTs.


Find Patent Forward Citations

Loading…