The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Dec. 19, 2002
Semiconductor integrated circuit device with test data output nodes for parallel test results output
Akira Yamazaki, Hyogo, JP;
Takeshi Fujino, Hyogo, JP;
Atsuo Mangyo, Hyogo, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
A semiconductor integrated circuit device includes test data output nodes arranged in a width of a plurality of bits and an internal data bus, greater in bit width than the test data output nodes, for transferring internal data. A predetermined number of bits of the internal data on the internal data bus are compared with bits of test expected value data equal in bit width to the test data output nodes for each bit. The predetermined number of bits of the internal data are selected in accordance with a test address signal. The bits selected is compared with the respective bits of the test expected valued data. Data indicating respective comparison results are output to the test data output nodes in parallel.