Apparatus, method, and program for measuring optical characteristic using quantum interference, and recording medium for recording the program

Abstract

To enable measuring optical characteristics of a device under test by overcoming a limit of detection sensitivity caused by detecting light as 'wave'. Of an entangled photon pair generated by entangled photon pair generating means, signal light transmits through a device under test (DUT), and idler light transmits through a variable delay line. The signal light after transmitting through the device under test (DUT), and the idler light after transmitting through the variable delay lineare supplied for a semi-transparent mirrorto generate quantum interference. Then, if the timing when photon of the first multiplexed light is detected by a first photon detector, and the timing when photon of the second multiplexed light is detected by a second photon detectormatch, a multipliersupplies a pulse, and a countercounts the pulse. Based on the count, characteristic measuring meansobtains match detection probability, thereby measuring optical parameters of the device under test. Since the measurement uses the quantum interference, it is possible to measure the optical characteristics of the device under test at a high accuracy, and in a wide dynamic range.