The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2006
Filed:
Dec. 11, 2003
Shuichi Matsuo, Tokyo, JP;
Shuichi Matsuo, Tokyo, JP;
Rigaku Corporation, Akishima, JP;
Abstract
Disclosed is a temperature correction method for a thermal analysis apparatus which measures electric current, voltage, and electric resistance of a measurement sample while changing the temperature of the measurement sample set between a pair of electrodes. The paired electrodes are connected by a reference substance, and a weight is set on the reference substance. The temperature at the time when the reference substance is fused and the weight falls cutting the reference substance is measured actually as melting point by a temperature sensor. Based on a difference between the actually measured value and a literature value of the melting point of the reference substance, the temperature measured by the temperature sensor is corrected. It is thus possible to correct precisely the results measured by the thermal analysis apparatus which deals with electric current, voltage, electric resistance, dielectric constant, electric capacity, thermal electromotive force, thermally stimulated current, and the like, as targets to be measured.