The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2006

Filed:

Oct. 22, 2002
Applicants:

Claude R. Gauthier, Cupertino, CA (US);

Aninda K. Roy, San Jose, CA (US);

Brian W. Amick, Austin, TX (US);

Inventors:

Claude R. Gauthier, Cupertino, CA (US);

Aninda K. Roy, San Jose, CA (US);

Brian W. Amick, Austin, TX (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for quantifying effects of resonance in an integrated circuit's power distribution network is provided. The power distribution network includes a first power supply line and a second power supply line to provide power to the integrated circuit. Test ranges are selected for two test parameters, reference voltage potential of a receiver and data transmission frequency of the integrated circuit. At each combination of the two test parameters, bit patterns are transmitted by the integrated circuit to the receiver. A comparison is made between the transmitted bits and the received bits to determine whether the transmitted bits were correctly received. The comparison may be used to determine and report a range of values for the reference voltage potential and data transmission frequency that allow the transmitted bits to be correctly received.


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