The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Jun. 20, 2002
Roelof DE Lange, Falmer, NL;
Bruno A. R. Vrebos, Falmer, NL;
Roelof De Lange, Falmer, NL;
Bruno A. R. Vrebos, Falmer, NL;
Panalytical B.V., Ea Almelo, NL;
Abstract
A device () for the examination of at least one material sample () which can be inserted into the device () and is irradiated by means of electromagnetic waves (), notably X-rays; in the measuring position the material sample () can be subjected to irradiation by means of the electromagnetic waves () and during a change of sample the beam path () can be interrupted by means of a closure element () which can be moved into the beam path. The device is constructed in such a manner that the closure element () is provided with a reference sample () on its side which faces the rays () in a manner such that a reference measurement can be performed thereon during a change of sample.