The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2006

Filed:

May. 30, 2003
Applicants:

Jae-hak Kim, Kyungki-do, KR;

Soo-geun Lee, Suwon, KR;

Kyung-woo Lee, Seoul, KR;

Inventors:

Jae-hak Kim, Kyungki-do, KR;

Soo-geun Lee, Suwon, KR;

Kyung-woo Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/4763 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for forming a metal interconnection layer of a semiconductor device comprises forming a film including a material selective to a medium used in an ashing process on an interlayer insulating film. The method comprises transforming the film during the ashing process to form an interconnection pattern having a dual damascene structure. A dielectric material such as copper is deposited on the interconnection pattern, which is planarized through CMP, thereby forming a via contact having a single damascene structure without a recess therein.


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