The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Aug. 13, 2002
Kenichi Ohtsubo, Inashiki-gun, JP;
Sumiko Nakamura, Inashiki-gun, JP;
Tsuyoshi Miyamura, Otsu, JP;
Satoshi Kumo, Otsu, JP;
Ikunoshin Kato, Otsu, JP;
Kenichi Ohtsubo, Inashiki-gun, JP;
Sumiko Nakamura, Inashiki-gun, JP;
Tsuyoshi Miyamura, Otsu, JP;
Satoshi Kumo, Otsu, JP;
Ikunoshin Kato, Otsu, JP;
National Food Research Institute, Tsukuba, JP;
Takara Bio Inc., Otsu, JP;
Abstract
Provided is a DNA-level grain variety discrimination method of detecting the presence or absence of any other varieties of grains in object grains of a certain variety through multiplex PCR that uses the DNAs extracted from the grains or from their processed products as templates. The method is characterized in that the multiplex PCR uses pair primer groups that are for discriminative detection of negative bands not appearing in the band pattern of the object variety but selectively appearing only in the band patterns of the other mixed varieties. The method has made it possible to rapidly and simply detect the presence or absence of mixed varieties in high-quality grains such as 'Koshihikari', and to identify the mixed varieties.