The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2006
Filed:
Dec. 22, 2003
Volker Seyfried, Nussloch, DE;
Rafael Storz, Heidelberg, DE;
Volker Seyfried, Nussloch, DE;
Rafael Storz, Heidelberg, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A method for separating different emission wavelengths in a scanning microscope includes scanning a specimen with an illuminating light beam by passing the illuminating light beam over the specimen using a beam deflector, and selectively applying each of a plurality of excitation wavelengths to the illuminating light beam during the scanning according to a predefinable illumination scheme. Emission light coming from the specimen is detected using a detector, the emission light including emission wavelengths corresponding to the excitation wavelengths. The detector is read out when an excitation wavelength is applied so as to provide detected signals. The detected signals are associated with the respective excitation wavelengths using the illumination scheme.