The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2006

Filed:

Dec. 21, 2004
Applicants:

Tsukasa Kojima, Sapporo, JP;

Junji Sakurada, Sapporo, JP;

Toshiyuki Tamai, Sapporo, JP;

Sadayuki Matsumiya, Kawasaki, JP;

Takafumi Kano, Kure, JP;

Kazushi Noguchi, Kure, JP;

Inventors:

Tsukasa Kojima, Sapporo, JP;

Junji Sakurada, Sapporo, JP;

Toshiyuki Tamai, Sapporo, JP;

Sadayuki Matsumiya, Kawasaki, JP;

Takafumi Kano, Kure, JP;

Kazushi Noguchi, Kure, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01); G01B 5/02 (2006.01); G01B 5/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A surface texture measuring instrument has a rotary table on which a workpiece is rotatably mounted, a Z-axis slider capable of moving in a Z-axis direction parallel to a rotation axis of the rotary table, an X-axis slider that is held by the Z-axis slider and is advanceable and retractable in an X-axis direction orthogonal to the rotation axis, a first arm that is held by the X-axis slider and is rotatable around a center line parallel to the X-axis, a second arm that is held by the first arm and is advanceable and retractable in a direction orthogonal to the X-axis, and a detector held by the second arm to measure a surface texture of the workpiece.


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