The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2006

Filed:

Dec. 19, 2002
Applicants:

John F. Zumkehr, Orange, CA (US);

John L. Bryan, Beaverton, OR (US);

Howard S. David, Portland, OR (US);

Klaus Ruff, Beaverton, OR (US);

Inventors:

John F. Zumkehr, Orange, CA (US);

John L. Bryan, Beaverton, OR (US);

Howard S. David, Portland, OR (US);

Klaus Ruff, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for optimizing a source synchronous clock reference signal timing to capture data from a memory device (e.g., DDR SDRAM) includes conducting an iterative two-dimensional data eye search for optimizing the delay of the source synchronous clock reference signal (e.g., DQS). Embodiments of the present invention are directed to tuning the delay for each device for the optimal margin in two dimensions: maximize the distance from the data eye walls and maximize the noise margin on the interface. An iterative data eye search is performed while varying the DQS delay timing and noise margin.


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