The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Apr. 17, 2001
Satoshi Umezu, Tokyo, JP;
Jun Miyajima, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Norio Arakawa, Tokyo, JP;
Satoshi Umezu, Tokyo, JP;
Jun Miyajima, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Norio Arakawa, Tokyo, JP;
Advantest Corporation, , JP;
Abstract
A measuring device, a measuring device controller, a measuring system, a measurement process performing method and a recording medium thereof which can easily and adequately perform a measurement process are provided. The present invention is constructed to include a program receiving unitfor receiving a control program, which comprises contents prescribing a measurement process, from said network; a memorizing unitfor memorizing the control program; an initiating instruction receiving unitfor receiving a program initiating instruction of the control program from the network; and a measurement control unitfor letting a measuring unitperform the measurement process based on the control program memorized by the memorizing unitin case the initiating instruction receiving unitreceives the program initiating instruction.