The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2006
Filed:
Oct. 07, 2004
Fern Nee Tan, Penang, MY;
Suk Yeak Lai, Penang, MY;
Tark Wooi Fong, Penang, MY;
Intel Corporation, Santa Clara, CA (US);
Abstract
A shielded test contactor to electrically couple a device to be tested to test circuitry, comprises conductive material covered by or embedded in non-conductive material and defining a well to receive the device. Contacts extend from the embedded conductive material to connect the embedded conductive material to ground. Preferably, the contacts are extensions of the conductive material, through the non-conductive material. A second non-conductive material is preferably provided to support the embedded conductive material and define a floor of the well. Electrical connectors are preferably also supported by the second non-conductive material adjacent to the well, to electrically couple the device to test circuitry. For example, the connectors may be pins supported by the second non-conductive material and extending into the well. Preferably, the height of the conductive material defining the well is at least twice the height of the device to be tested.