The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Apr. 18, 2002
Applicant:

Kim Chai NG, San Diego, CA (US);

Inventor:

Kim Chai Ng, San Diego, CA (US);

Assignee:

STMicroelectronics, Inc., Carrollton, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing system and method for smoothing irregularities from 3D image information that was reconstructed from a plurality of 2D views of a scene, and particularly from homogeneous surfaces of objects in a scene. The method defines a window that overlaps a plurality of pixels of one of a plurality of 2D image views of a scene. Each pixel is associated with predefined 3D depth information, and further is associated with a matching curve. A subject pixel is located within the plurality of pixels overlapped by the window. The method calculates an average 3D depth information associated with the plurality of pixels overlapped by the window, and assigns the calculated average 3D depth information to the 3D depth information of the subject pixel, if the calculated average 3D depth information is within an error region of a matching curve associated with the subject pixel.


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