The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2006

Filed:

Nov. 17, 2001
Applicants:

Ralf Kilian, Köln, DE;

Randolf Rolff, Kerpen-Horrem, DE;

Gerhard Küster, Köln, DE;

Ralf Hirche, Köln, DE;

Inventors:

Ralf Kilian, Köln, DE;

Randolf Rolff, Kerpen-Horrem, DE;

Gerhard Küster, Köln, DE;

Ralf Hirche, Köln, DE;

Assignee:

Inficon GmbH, , DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting a test gas present at a measuring location, using an infrared gas analyzer having a cuvette, an infrared light source, an infrared detector, and two gas lines. A first gas line is adapted to take up a measuring gas at a measuring location that may contain a test gas to the cuvette. The second gas line is adapted to take up gas from the surroundings of the measuring location (i.e., reference gas), that may contain a test gas background that is to be taken into consideration when detecting the test gas taken up at the measuring location. To improve the sensitivity of the analyzer, only one cuvette and the measuring gas is taken up at the measuring location and the reference gas is fed to the cuvette such that each gas is alternately present therein.


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