The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2006
Filed:
Nov. 24, 2003
Richard M. Wasserman, Kirkland, WA (US);
Paul G. Gladnick, Seattle, WA (US);
Kim W. Atherton, Kirkland, WA (US);
Richard M. Wasserman, Kirkland, WA (US);
Paul G. Gladnick, Seattle, WA (US);
Kim W. Atherton, Kirkland, WA (US);
Mitutoyo Corporation, Kawasaki, JP;
Abstract
Auto focus systems and methods for a machine vision metrology and inspection system provide high speed and high precision auto focusing, while using relatively low-cost and flexible hardware. One aspect of various embodiments of the invention is that the portion of an image frame that is output by a camera is minimized for auto focus images, based on a reduced readout pixel set determined in conjunction with a desired region of interest. The reduced readout pixel set allows a maximized image acquisition rate, which in turn allows faster motion between auto focus image acquisition positions to achieve a desired auto focus precision at a corresponding auto focus execution speed that is approximately optimized in relation to a particular region of interest. In various embodiments, strobe illumination is used to further improve auto focus speed and accuracy. A method is provided for adapting and programming the various associated auto focus control parameters.