The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Aug. 06, 2003
Akihiro Shimase, Hitachinaka, JP;
Hiroyasu Uchida, Hitachinaka, JP;
Katsuhiro Kambara, Hitachinaka, JP;
Tomoyuki Tobita, Hitachinaka, JP;
Akihiro Shimase, Hitachinaka, JP;
Hiroyasu Uchida, Hitachinaka, JP;
Katsuhiro Kambara, Hitachinaka, JP;
Tomoyuki Tobita, Hitachinaka, JP;
Hitachi High Technologies Corp., Tokyo, JP;
Abstract
A sample dispensing apparatus is realized which can detect a dispensing abnormality occurred during the sample dispensing operation regardless of the type and the extent of the abnormality. A pressure sensor is connected to a dispensing flow passage system, including a sample probe and a dispensing syringe, and a plurality of output values of the pressure sensor during the sample dispensing operation are taken in. A multi-item analysis (based on the Mahalanobis distance) is carried out by using, as items, the plurality of taken-in output values of the pressure sensor. Whether the dispensing is normally performed or not is determined by comparing an analysis result with a threshold. A highly reliable determination result is obtained in spite of variations of sensitivity of the pressure sensor.