The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Apr. 04, 2002
Mark Ries Robinson, Albuquerque, NM (US);
Cliona Fleming, Albuquerque, NM (US);
Howland Jones, Albuquerque, NM (US);
Mark Rohrscheib, Albuquerque, NM (US);
Mark Ries Robinson, Albuquerque, NM (US);
Cliona Fleming, Albuquerque, NM (US);
Howland Jones, Albuquerque, NM (US);
Mark Rohrscheib, Albuquerque, NM (US);
InLight Solutions, Inc., Albuquerque, NM (US);
University of New Mexico, Albuquerque, NM (US);
Abstract
A method is provided for building improved calibration models or for improving modifications to these models or validation of the models used in the non-invasive spectroscopic measurement of an analyte or attribute of tissue. The method uses a matched reference sample and measurement of that sample to ensure that the correct relationship between the spectra and analyte is made during the model building, modification or calibration process. A matched reference sample is one in which the analyte of interest or attribute of interest in the reference sample is representative of the analyte or attribute at the site being non-invasively sampled or the agreement between the reference concentration and the non-invasively sampled concentration is clinically significant.