The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2006
Filed:
Aug. 30, 2001
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Hideya Takeo, Kaisei-machi, JP;
Takashi Imamura, Kaisei-machi, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
An anomalous shadow detection system capable of obtaining stable detection capacity across all facilities into which the system is introduced, regardless of variations in the conditions of the image obtaining environments of each facility is provided. An image obtaining means obtains an image of a standard-phantom, and an image readout means obtains phantom-image data thereof. Said phantom-image data is input to an evaluative model detecting means which detects evaluative models contained within the image of the standard-phantom. An evaluating means compares the detected evaluative models to a desired detection level. If the detected evaluative models are of a different detection level than the desired detection level, a parameter setting means resets the detection parameter, depending on the result obtained by the evaluating means, and the above processing of the phantom-image data is repeated until the detection result and the desired detection level are the same.