The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2006

Filed:

Mar. 15, 2002
Applicant:

Francine J. Prokoski, Fairfax, VA (US);

Inventor:

Francine J. Prokoski, Fairfax, VA (US);

Assignee:

Mikos, Ltd., Fairfax Station, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system using passive infrared imaging of the face and other body parts of an operator to obtain observables by automatically extracting features from a sequence of images, analyzing the extracted features, and then assessing the results for indicators of performance of a task by the operator in order to provide early warning of potential cognitive or motor impairment and thereby facilitate risk reduction and quality maintenance. The infrared condition monitoring system (IR-CMS) serves to a) assess cognitive and/or physical readiness to perform a particular task; b) provide condition assessment feedback to the subject and his appropriate supervisors; c) activate measures to increase short-term alertness and other readiness factors; d) limit potential risks by restricting the subject's access, responsibility, or authority; and e) facilitate rapid medical treatment, evacuation, quarantine, re-training, or counseling as appropriate. The same condition monitoring and assessment system can also be used during training and simulator exercises to evaluate personnel for assignment.

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