The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Jul. 09, 2004
Applicants:

John Wang, San Jose, CA (US);

Zhigang Wang, Santa Clara, CA (US);

Xin Guo, Mountain View, CA (US);

Inventors:

John Wang, San Jose, CA (US);

Zhigang Wang, Santa Clara, CA (US);

Xin Guo, Mountain View, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for standard reference cell design is herein disclosed. The method includes determining a first number of individual bits to be employed in a standard reference cell design based on the number of individual bits that are included in core memory cells that are to be measured using the standard reference cell. The method further includes determining a range of variation in the core memory cells to be measured that is due to process variation in the generation of the core memory cells. In addition, the method includes determining an additional number of individual bits to be included in the standard reference cell design based on the determined range of variation. A standard reference cell that includes a number of individual bits equal to the sum of both the first and the additional number of individual bits is generated.


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