The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Jul. 30, 2004
Applicants:
Ting-kuo Kang, Kao-Hsiung Hsien, TW;
Yi-fan Chen, Tai-Chung, TW;
Chia-jen Kao, Hsin-Chu, TW;
Inventors:
Assignee:
United Microelectronics Corp., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention utilizes wafer acceptance testing equipment to fast monitor the quality of an insulation layer. A plurality of swing time-dependent DC ramping voltages are applied to one of the electrode plates in a capacitor and each corresponding leakage current is measured to calculate each corresponding β value. Then, a ratio of each β value is calculated and a β-voltage curve is plotted to actually simulate the device failure.
Kang, Ting-Kuo. (2006). Method for monitoring quality of an insulation layer (U.S. Patent No. 7019545). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7019545
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