The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Aug. 29, 2001
Applicants:

William K. Lam, Newark, CA (US);

Victor Chang, Palo Alto, CA (US);

Inventors:

William K. Lam, Newark, CA (US);

Victor Chang, Palo Alto, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method for detecting and isolating software bugs and generating a minimal set of stimuli to reproduce the bugs. The present invention utilizes a recursive algorithm to compare the output of successively smaller software blocks of a program in development to a verified output sample. The smallest software blocks which are found to contain a bug are isolated. For each of these isolated blocks, the smallest input vector is determined such that the application of this vector to the block expresses the bug. The present invention utilizes a separate recursive algorithm to determine these minimal vectors.


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