The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Sep. 07, 2001
Hong S. Kim, Milpitas, CA (US);
Kuan-yu J. Lin, San Jose, CA (US);
Hong S. Kim, Milpitas, CA (US);
Kuan-yu J. Lin, San Jose, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method of generating a test vector pattern for an array, including determining a failure of a test of the array, defining a type of test vector pattern to generate using a graphical user interface, generating the test vector pattern, and testing the array using the test vector pattern. A test vector pattern generation tool, including an array, a test vector pattern, and a graphical user interface generating the test vector pattern. The array is tested using the custom test vector pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile