The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Nov. 26, 2002
Applicants:

Yakov Roizin, Afula, IL;

Micha Gutman, Haifa, IL;

Shimon Greenberg, Hod Hasharon, IL;

Alfred Yankelevich, Haifa, IL;

Inventors:

Yakov Roizin, Afula, IL;

Micha Gutman, Haifa, IL;

Shimon Greenberg, Hod Hasharon, IL;

Alfred Yankelevich, Haifa, IL;

Assignee:

Tower Semiconductor Ltd., Migdal Haemek, IL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-volatile memory cell capable of storing more than two bits of information. The NVM cell includes a semiconductor region having a first conductivity type, and a plurality of field isolation regions located in the semiconductor region. Four or more source/drain regions are located in the semiconductor region adjacent to the field isolation regions, the source/drain regions having a second conductivity type, opposite the first conductivity type. The field isolation regions and the source drain regions laterally surround a channel region in the semiconductor region. A gate structure, including a floating gate structure and a control gate structure, extends over the channel region, portions of the field isolation regions and portions of the source/drain regions. The floating gate structure includes a plurality of charge trapping regions, wherein each of the charge trapping regions is located adjacent to a corresponding one of the source/drain regions.


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