The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Oct. 16, 2002
Applicants:

Takeshi Fukumori, Tokyo, JP;

Shigeharu Kanemoto, Tokyo, JP;

Nobuhiro Matsumoto, Tokyo, JP;

Takamasa Mesaki, Tokyo, JP;

Hiroyuki Maehara, Tokyo, JP;

Yuka Kuribayashi, Tokyo, JP;

Michiko Matsuda, Tokyo, JP;

Kazuo Amano, Tokyo, JP;

Inventors:

Takeshi Fukumori, Tokyo, JP;

Shigeharu Kanemoto, Tokyo, JP;

Nobuhiro Matsumoto, Tokyo, JP;

Takamasa Mesaki, Tokyo, JP;

Hiroyuki Maehara, Tokyo, JP;

Yuka Kuribayashi, Tokyo, JP;

Michiko Matsuda, Tokyo, JP;

Kazuo Amano, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/64 (2006.01); B07C 5/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A quality evaluation method and apparatus for non-bran rice evaluate quality or taste of non-bran rice by identifying proportions of a hull layer, an aleurone layer, an endosperm layer, which adhere to a surface of the non-bran rice according to luminance levels of self-emitted fluorescence obtained by irradiating the non-bran rice with excitation light.


Find Patent Forward Citations

Loading…