The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2006

Filed:

Mar. 29, 2001
Applicants:

Jingsheng Jason Cong, Pacific Palisades, CA (US);

Zhigang David Pan, White Plains, NY (US);

Prasanna V. Srinivas, San Jose, CA (US);

Inventors:

Jingsheng Jason Cong, Pacific Palisades, CA (US);

Zhigang David Pan, White Plains, NY (US);

Prasanna V. Srinivas, San Jose, CA (US);

Assignee:

Magma Design Automation, Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for identifying potential noise failures in an integrated circuit design is described. In one embodiment, the method comprises locating a victim net and an aggressor within the integrated circuit design, modeling the victim net using two π-type resistor-capacitor (RC) circuits, including determining a coupling between the victim net and the aggressor, and indicating that the integrated circuit design requires modification if modeling the victim net indicates that a potential noise failure may occur in the integrated circuit design.


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