The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2006

Filed:

Jun. 21, 2002
Applicants:

Shashi P. Desai, San Jose, CA (US);

Timothy C. Dunn, San Francisco, CA (US);

Matthew J. Lesho, San Carlos, CA (US);

Russell O. Potts, San Francisco, CA (US);

Janet A. Tamada, Stanford, CA (US);

Charles W. Wei, Fremont, CA (US);

Inventors:

Shashi P. Desai, San Jose, CA (US);

Timothy C. Dunn, San Francisco, CA (US);

Matthew J. Lesho, San Carlos, CA (US);

Russell O. Potts, San Francisco, CA (US);

Janet A. Tamada, Stanford, CA (US);

Charles W. Wei, Fremont, CA (US);

Assignee:

Animas Technologies, LLC, West Chester, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to methods to increase the number of analyte-related signals used to provide analyte measurement values, e.g., when two or more analyte-related signals are used to obtain a single analyte measurement value a 'rolling' value based on the two or more signals can be employed. In another aspect, interpolation and/or extrapolation methods are used to estimate unusable, missing or error-associated analyte-related signals. Further, interpolation and extrapolation of values are employed in another aspect of the invention that reduces the incident of failed calibrations. Further, the invention relates to methods, which employ gradients and/or predictive algorithms, to provide an alert related to analyte values exceeding predetermined thresholds. The invention includes the above-described methods, one or more microprocessors programmed to execute the methods, one or more microprocessors programmed to execute the methods and control at least one sensing and/or sampling device, and monitoring systems employing the methods described herein.

Published as:
WO03000127A2; US2003050546A1; WO03000127A3; US2005049473A1; US7011630B2; US7699775B2;

Find Patent Forward Citations

Loading…