The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2006

Filed:

Apr. 09, 2003
Applicants:

Alexander Gyure, San Jose, CA (US);

Jindrich Zejda, Sunnyvale, CA (US);

Peivand Fallah-tehrani, Camarillo, CA (US);

Wenyuan Wang, Fremont, CA (US);

Chi-chong Lo, San Jose, CA (US);

Mahmoud Shahram, Cupertino, CA (US);

Yansheng Luo, Fremont, CA (US);

William Chiu-ting Shu, Palo Alto, CA (US);

Seyed Alireza Kasnavi, Sunnyvale, CA (US);

Inventors:

Alexander Gyure, San Jose, CA (US);

Jindrich Zejda, Sunnyvale, CA (US);

Peivand Fallah-Tehrani, Camarillo, CA (US);

Wenyuan Wang, Fremont, CA (US);

Chi-Chong Lo, San Jose, CA (US);

Mahmoud Shahram, Cupertino, CA (US);

Yansheng Luo, Fremont, CA (US);

William Chiu-Ting Shu, Palo Alto, CA (US);

Seyed Alireza Kasnavi, Sunnyvale, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 19/00 (2006.01); G01R 31/28 (2006.01); G01R 27/28 (2006.01); G01R 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.


Find Patent Forward Citations

Gyure, Alexander. (2006). Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit (U.S. Patent No. 7007252). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7007252

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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