The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Apr. 09, 2003
Alexander Gyure, San Jose, CA (US);
Jindrich Zejda, Sunnyvale, CA (US);
Peivand Fallah-tehrani, Camarillo, CA (US);
Wenyuan Wang, Fremont, CA (US);
Chi-chong Lo, San Jose, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Yansheng Luo, Fremont, CA (US);
William Chiu-ting Shu, Palo Alto, CA (US);
Seyed Alireza Kasnavi, Sunnyvale, CA (US);
Alexander Gyure, San Jose, CA (US);
Jindrich Zejda, Sunnyvale, CA (US);
Peivand Fallah-Tehrani, Camarillo, CA (US);
Wenyuan Wang, Fremont, CA (US);
Chi-Chong Lo, San Jose, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Yansheng Luo, Fremont, CA (US);
William Chiu-Ting Shu, Palo Alto, CA (US);
Seyed Alireza Kasnavi, Sunnyvale, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.