The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Jun. 23, 2003
Applicant:
Volker Seyfried, Nussloch, DE;
Inventor:
Volker Seyfried, Nussloch, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention discloses a method for microscopy in which a specimen is illuminated with pulsed illuminating light that comprises light from a spectral region, and detection light proceeding from the specimen is detected in a detection spectral region. The method is characterized in that the detection spectral region lies within the spectral region, and that the illuminating light contains no light from the detection spectral region or at least none having the same polarization properties. A microscope is additionally disclosed.