The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Jan. 14, 2004
Masaki Ishikawa, Tokyo, JP;
Masaki Matsumoto, Hitachinaka, JP;
Yoshihiro Nishikawa, Hitachi, JP;
Yasuaki Takada, Kiyose, JP;
Hisashi Nagano, Hachioji, JP;
Masami Sakamoto, Hitachinaka, JP;
Masaki Ishikawa, Tokyo, JP;
Masaki Matsumoto, Hitachinaka, JP;
Yoshihiro Nishikawa, Hitachi, JP;
Yasuaki Takada, Kiyose, JP;
Hisashi Nagano, Hachioji, JP;
Masami Sakamoto, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
Firstly, the following check chip is set up into a heater: A check chip onto which a sample has been picked up by wiping out the surface of a check target, or a check chip formed by absorbing and collecting the sample into a filter. Here, the filter has been set up in a vibration-type or heating-type portable-type absorption probe in an attachment/detachment-capable manner. Secondly, a sample gas generated from the heated check chip is analyzed using a tandem-type mass spectrometer. This makes it possible to simplify the sample pick-up from various types of check targets, and to shorten the pick-up time and the checking time.