The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Aug. 06, 2003
Norbert Rehm, Kanagawa-ken, JP;
Hans-oliver Joachim, Kanagawa-ken, JP;
Michael Jacob, Kanagawa-ken, JP;
Joerg Wohlfahrt, Kanagawa-ken, JP;
Norbert Rehm, Kanagawa-ken, JP;
Hans-Oliver Joachim, Kanagawa-ken, JP;
Michael Jacob, Kanagawa-ken, JP;
Joerg Wohlfahrt, Kanagawa-ken, JP;
Infineon Technologies AG, Munich, DE;
Abstract
A memory cell signal window testing apparatusand method for testing the signal window of a memory are disclosed. First data is written to a memory cell during a write cycle. A low cell signal is read from the memory cell during a first read cycle. A comparison is made between the low signal and a low reference signal. The result of the comparison is stored in a first storage register. Second data is then written to the memory cell during a write cycle. A high cell signal is read from the memory cell during a second read cycle. A comparison is made between the high cell signal and a high reference signal. The result of the comparison is stored in a second storage register. The results in the first and second storage registers are compared and an output is provided indicating that the memory cell has failed the test if the comparison shows that both the low cell signal is higher than the low reference signal and the high cell signal is lower than the high reference signal.