The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Sep. 29, 2000
Applicants:

Megumi Yamaoka, Tokyo, JP;

Kenji Nagao, Kanagawa, JP;

Inventors:

Megumi Yamaoka, Tokyo, JP;

Kenji Nagao, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object recognizing apparatus is provided which is capable of precisely recognizing an object in an input image with the use of a corresponding learning image even when a local-segment of the input image coincides with a learning-local-segment of another similar learning image. The apparatus comprises (1) image dividing means for dividing an input image, which is received from image input means, into local-segments, (2) similar-local-segment extracting means for extracting a similar learning-local-segment to the local-segment of the input image from a learning image database, (3) object position estimating means for estimating the position of an object to be identified in the input image from the coordinates of the local-segment and the coordinates of the learning-local-segment corresponding to the local-segment, (4) counting means for counting the local-segments coincide with their corresponding learning-local-segments, and (5) object determining means for judging that the object to be identified is present when a result of counting is greater than a predetermined number. Consequently, the object and its position in any input image can be detected at higher accuracy.


Find Patent Forward Citations

Loading…