The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Feb. 28, 2002
Applicants:

Michitaro Kanamitsu, Ome, JP;

Yoshinori Takase, Tokyo, JP;

Shoji Kubono, Ome, JP;

Inventors:

Michitaro Kanamitsu, Ome, JP;

Yoshinori Takase, Tokyo, JP;

Shoji Kubono, Ome, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A nonvolatile semiconductor storage unit can prevent erratic sense operations in a sense latch circuit by adopting a single-end sensing system capable of reducing an area (decreasing the number of elements). There is provided a flash memory chip using the single-end sensing system and an NMOS gate sensing system together. In the single-end sensing system, the sense latch circuit is connected to one end of a global bit line to detect data on the global bit line corresponding to a threshold voltage for a memory cell. The NMOS gate sensing system uses an NMOSFET to receive data on the global bit line at a gate and drive a node for the sense latch circuit. The NMOSFET senses a sense voltage. The sense latch circuit is activated with a sufficient signal quantity ensured. An output voltage from a threshold voltage applying power supply precharges the global bit line. In this manner, it is possible to always keep a constant difference between a precharge voltage and a threshold voltage for the NMOSFET.


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