The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2006
Filed:
Nov. 14, 2001
Kuo-chen Lin, Tainan, TW;
Ming-hong Hsieh, Tainan, TW;
Kuo-Chen Lin, Tainan, TW;
Ming-Hong Hsieh, Tainan, TW;
Taiwan Semiconductor Manufacturing Company, Hsin-Chu, TW;
Abstract
A new data processing and display method for use in interactive manufacturing process management is achieved. A first variable value, such as WIP, for a manufacturing stage is uploaded from a database and is subtracted from a first target value to obtain a first variable variance. A first variable variance bar is displayed above a stage axis on a graphical display device and is non-filled if the first variable variance is positive and is filled if the first variable variance is negative. A second variable value, such as production moves, is uploaded and is subtracted from a second target value to obtain a second variable variance. A second variable value bar is displayed below the stage axis on the graphical display device and is non-filled. A second variable variance bar is displayed below the second variable value bar on the graphical display device if the second variable variance is positive.