The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2006

Filed:

Jul. 27, 2004
Applicants:

Greg Bazan, Essex Junction, VT (US);

John M. Cohn, Richmond, VT (US);

Matthew S. Grady, Burlington, VT (US);

Phillip J. Nigh, Williston, VT (US);

Leah M. P. Pastel, Essex, VT (US);

Thomas G. Sopchak, Williston, VT (US);

Inventors:

Greg Bazan, Essex Junction, VT (US);

John M. Cohn, Richmond, VT (US);

Matthew S. Grady, Burlington, VT (US);

Phillip J. Nigh, Williston, VT (US);

Leah M. P. Pastel, Essex, VT (US);

Thomas G. Sopchak, Williston, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit and a method for monitoring defects in an integrated circuit chip. The circuit including a defect monitor portion and a sense element portion, the defect monitor portion either coupled to inputs of sense elements arranged in a chain or coupled between sense elements and forming portions of the chain.


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