The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Jul. 11, 2003
Applicants:
Uzi Lev-ami, Mountain View, CA (US);
Guenter Sifnatsch, Santa Clara, CA (US);
Mark Attwood, Morgan Hill, CA (US);
Inventors:
Uzi Lev-Ami, Mountain View, CA (US);
Guenter Sifnatsch, Santa Clara, CA (US);
Mark Attwood, Morgan Hill, CA (US);
Assignee:
MKS Instruments, Inc., Andover, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A graphical user interface for enabling a user to graphically observe on a displaying mechanism a statistical measure of the process quality of a manufacturing process provides for the display of an icon representing a workpiece. The location and color of the icon on the displaying mechanism indicates the process quality of the manufacturing process for the represented workpiece.