The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

Aug. 27, 2004
Applicants:

Willem Hendrik Maes, Lommel, BE;

Robertus Johannes Michael Vucht, Best, NL;

Hendrikus Petrus Maria Sterken, Deurne, NL;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 29/56 (2006.01); H01J 29/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method for performing focusing in a particle-optical device with the aid of astigmatism in the particle beam. In a particle-optical device such as an electron microscope it is advantageous to perform the process of focusing automatically. In accordance with the invention, the electron beam which is to be focused is deliberately made astigmatic to a certain degree. With this astigmatic beam, two images of a specimen are made at two different settings of the objective, after which in each of the images the direction of the astigmatic smearing is determined—for example, with the aid of a two-dimensional Fourier transform (FFT). The directions of the astigmatic smearing are perpendicular to each other if, in the transition from a first setting of the objective to a second one, the point of optimum focus is passed. Through a process of interpolation (which process may be iterative) between these two settings, the point of optimum focus can now be determined. Possible anisotropy in the specimen itself can be eliminated by making two images at both of the settings of the objective and by subtracting the FFTs thereof from each other.


Find Patent Forward Citations

Loading…