The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Nov. 13, 2003
Yuet-ying Yu, Hopewell Junction, NY (US);
Paul F. Bodenweber, Kingston, NY (US);
Charles J. Hendricks, Wappingers Falls, NY (US);
Frank C. Seelmann, Gardiner, NY (US);
Yuet-Ying Yu, Hopewell Junction, NY (US);
Paul F. Bodenweber, Kingston, NY (US);
Charles J. Hendricks, Wappingers Falls, NY (US);
Frank C. Seelmann, Gardiner, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for utilizing a multi-probe tester to test an electrical device having a plurality of contact pads. Multi-probe tester test probes and electrical device contact pads are arrayed in a common distribution pitch, wherein at least one test probe is masked, thereby preventing the at least one test probe from returning a test result to the testing apparatus. In one embodiment mask membrane physically prevents at least one test probe from making contact with the electrical device. In another embodiment at least one software command is provided configured to cause an input from at least one test probe to be disregarded during a test routine. Another embodiment features both mask membrane and software command probe masking.