The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Feb. 05, 2001
Douglas J. Cutter, Fort Collins, CO (US);
Adrian E. Ong, Pleasanton, CA (US);
Fan Ho, Sunnyvale, CA (US);
Kurt D. Beigel, Boise, ID (US);
Brett M. Debenham, Meridian, ID (US);
Dien Luong, Boise, ID (US);
Kim Pierce, Meridian, ID (US);
Patrick J. Mullarkey, Meridian, ID (US);
Douglas J. Cutter, Fort Collins, CO (US);
Adrian E. Ong, Pleasanton, CA (US);
Fan Ho, Sunnyvale, CA (US);
Kurt D. Beigel, Boise, ID (US);
Brett M. Debenham, Meridian, ID (US);
Dien Luong, Boise, ID (US);
Kim Pierce, Meridian, ID (US);
Patrick J. Mullarkey, Meridian, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.