The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Jan. 09, 2002
Jenn-kwei Tyan, Princeton, NJ (US);
Ming Fang, Princeton Jct., NJ (US);
Jenn-Kwei Tyan, Princeton, NJ (US);
Ming Fang, Princeton Jct., NJ (US);
Siemens Corporate Research, Inc., Princteon, NJ (US);
Abstract
A system and method for object inspection includes an object modeler; an iterative object segmentor in signal communication with the object modeler for receiving an input image and model parameters and producing a segmented image; a moment transformer in signal communication with the iterative object segmentor for receiving an input image, model parameters and a segmented image and producing estimates of object translation, rotation and scaling; an edge detector and interpolator in signal communication with the moment transformer for receiving an input image, model parameters and estimates and producing a set of line edges; and an iterative optimizer in signal communication with the edge detector and interpolator for receiving an input image, model parameters, estimates and line edges and producing refined estimates of object translation, rotation and scaling.