The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Jan. 22, 2001
Applicants:

Trung Nguyen, San Jose, CA (US);

Hung Truong, San Jose, CA (US);

Oanh Kim, Hayward, CA (US);

Inventors:

Trung Nguyen, San Jose, CA (US);

Hung Truong, San Jose, CA (US);

Oanh Kim, Hayward, CA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R031/08 ;
U.S. Cl.
CPC ...
Abstract

Envelope detector and method for determining whether the level of a differential input signal DPIN−DNIN is above a reference voltage V. The differential input signal is converted to a differential current IDP−IDN, the reference voltage is converted to a reference current I, the currents are compared to determine if |IDP−IDN| is greater than I, and a valid differential signal is indicated when |IDP−IDN| is greater than I.


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