The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

Jun. 30, 2003
Applicants:

Chih-chuan Lin, San Jose, CA (US);

Sunil D. Mehta, San Jose, CA (US);

Inventors:

Chih-Chuan Lin, San Jose, CA (US);

Sunil D. Mehta, San Jose, CA (US);

Assignee:

Lattice Semiconductor Corp., Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L029/72 ;
U.S. Cl.
CPC ...
Abstract

An EEPROM device exhibiting high saturation current and low signal propagation delay and a process for fabricating the device that includes the formation of refractory metal silicide regions in the source and the drain regions and the gate electrode of an MOS transistor within an EEPROM memory cell. A floating-gate protect layer is formed over the floating-gate electrode and a relatively thick cap oxide layer is formed to overlie the floating-gate protect layer and the source and drain regions and gate electrode of the MOS transistor. A doped oxide layer is formed to overlie the cap oxide layer. The cap oxide layer is formed to a thickness sufficient to create strain in the channel region of the MOS transistor, while not having a thickness that could cause poor data retention in the EEPROM memory cell.


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